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System features:

• Faster measuring speed: It allows the user to check the active and passive array patterns as well as the active power and the sensitivity in real-time. In addition, the probe is symmetrically distributed. Under normal measuring condition, simply rotate the orientation and the probe will carry out comprehensive measuring for the tested object.
  

• Powerful function: It supports most of the standard active and passive test for 2G, 3G, 4G, WIFI and GPS devices operated within 650MHz~6GHz range.
  

• More convenient: As the measurement of this system is physically smaller than the conventional chamber, it solves the problem of broader chamber space and inaccessible installation usually seen in conventional chamber. In the meantime, the system can be moved to any direction without affecting the performance. In this way, it can be used by coping with the space/orientation shifting, moving and unit sharing in more convenient way and the relocation cost is therefore saved.
  

• Lower cost: The system is designed with self-shielding function. There's no need to build another Shielding Chamber. Lower in cost. 
  

• Stronger compatibility: It can be easily used with the network analyzer and general tester normally used by Rhode &  Schwarz, Agilent and Anritsu.
  
  

Test function:

Test speed:

1. Parameter：
   

   OTA Active Measuring Duration
   Real-time Power Test	1s
   Real-time Sensitivity Test	10s
   TRP Test (GSM3Ch)	2-3 minutes
   TIS Gest (GSM 1Ch)	3-8 minutes
   Checking Array Pattern	Real-time
   Passive Test Duration
   Checking Array Pattern	Real-time
   10 Frequency Test (under X1)	Less than 2 minutes
   Parameter can be tested and retrieved.	Gain, efficiency, array pattern, cross polarization ratio, front-to-back ratio, correlativity coefficient, and phase center, etc.

2. This system allows the user to check the active and passive array patterns as well as the active power and the sensitivity in real-time manner. In addition, the probe is symmetrically distributed. Under normal measuring condition, simply rotate the orientation around 180° and the probe will carry out comprehensive measuring for the tested object.
   
   
   

Test data：
The near-field data required for the system testing. By changing from near-field to far-field, accurate and reliable far-field data can be retrieved which is the function incomparable by the similar product available in current market.
　
Test items　　　　Repetitiveness       　　　　　
TRP ±0.2dB TRP ±0.5dB
TIS ±0.6dB TIS ±1.0dB
Efficiency ±0.2dB
Gain ±0.2dB

Oversampling capability：
This system can achieve the sampling at 22.5° interval. Through self-rotation function, it is designed with multiple sampling technology where the samples can be selected at 1.125° high-density level. The system also provides 80,000 more sampling points on the spherical surface.
It achieves the seamless coverage required for the test in providing wider test dead zone.

Oversampling coefficient　　 Oversampling angleX1 22.5°
X2 11.25°
X3 7.5°
X10 2.25°
X20 1.125°

Basic parameters:
Probe number: 15 units
Test frequency scope: 650MHz~6GHz
Shielding efficacy: ≧100dB   
Max. size o tested device (DUT): 45cm
Max. weight of tested device: 15kg
Typical dynamic scope: 60dB~80dB
Outline dimensions: 1.80m*1.27m*1.98m(L*W*H)
Angle between probes under same band: 22.5°